Microprocessor, EPROM Test and WIP Automation

• semiconductor chip manufacturing test and yield analysis
• robotic test station and wafer die stepping
• work-in-process manufacturing control
• automated station integration
• Assembly X86, UNIX, RS-232, IEEE-488
  

Telecommunications Calling Card Software

• time-critical transaction processing
• fault tolerant, parallel processing, real-time operating system
• hierarchical database schema, DDL, management
• object-oriented data modeling, reusable DBMS libraries
• 1 million records, 1000 transactions/second
• C, Hierarchical DB, CASE, RISC
  

Solar Power Plant Control and Automation

• real-time process control of plant operations
• heliostat-mirror solar tracking algorithms and aiming control
• beam characteristic analysis and image processing
• experimental control of thermo heat simulation
• data acquisition, storage, report formatting
• programmable logic control algorithms
• safety monitoring, alarming and auto-shutdown
• graphical operator interface, process control, alarm display